HIPS and SIPS Seminar at RESON User Conference

CARIS USA's' Josh Mode explains the latest enhancement in the HIPS and SIPS softwareOver 20 people attended the CARIS HIPS and SIPS seminars at the RESON User Conference taking place in Jersey City, USA, this week. The seminar highlighted the latest processing workflows and techniques and included a sneak preview of our Water Column Imaging support for least depth detection. Attendees came from a variety of organizations including US NAVO, NOAA, Fugro, SAIC, EMC, CIDCO, Oceaneering International and Seatronics amongst others. Many thanks to RESON USA for giving us time in the spotlight at their show.

Published 2011-11-18

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